x-ray electron probe

Atomic absorption spectrometry (AAS), scanning electron microscopy (SEM), and energy dispersive X-ray spectrometry (EDXS) are carried out to characterize the deposition on fiber probe.

通过使用原子吸收光谱仪，扫描显微镜和能量色散X射线谱仪对覆膜光纤探针进行表征。

The microstructure and properties of the composite coatings were investigated by optical microscopy, X-ray diffractometer, electron probe microanalyzer and a skimming wear machine.

利用金相显微镜、X射线衍射仪、电子探针及滑动磨损试验机，研究了合金熔覆层的显微组织及性能。

The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM).

分别用电子探针（EPMA）、X衍射（XRD）和扫描电镜（SEM）查证了其组分、相结构和显微结构的梯度分布。