spectroscopy X-ray fluorescence

The two main techniques that are discussed in this book are the x-ray fluorescence spectroscopy (XRF) and the x-ray fine structure analysis (XAFS).

被在这本书里讨论的两种主要技术是X光莹光分光学（XRF）和X光好的架构分析（XAFS）。

And by IR, TGA, fluorescence spectroscopy and X-ray diffraction on the crystal structure and properties were characterized and studied.

并且通过IR、TGA、荧光光谱分析和X -射线单晶衍射对晶体结构和性质进行了表征和研究。

We utilized the electrochemistry, scanning electron micrograph, X-ray fluorescence spectroscopy and X-ray photoelectron spectroscopy to demonstrate this mechanism.

我们用电化学方法、扫描电镜、X射线光电子能谱和X射线荧光光谱法对此进行了证明。