Leakage current measurements

Some of these tests include a variety of leakage current measurements.

其中有些测试工作包括各种泄漏电流的测量。

Once the leakage current in a given pathway is known and remains consistent, it can be subtracted from subsequent measurements.

一旦知道了给定通路的漏流，并保持稳定，即可从随后的测量值中减去该值。

Various MOSFET tests require making low current measurements. Some of these tests include gate leakage, leakage current vs. temperature, substrate to-drain leakage, and sub-threshold current.

各种MOSFET测试都要求进行弱电流的测量。这些测试包括栅极漏电、泄漏电流与温度的关系、衬底对漏极的漏电和亚阈区电流等。