Build in Self Test

Moreover, a scan test circuit was proposed. This circuit can implement scan test and high speed build in self test (BIST) for IP core chip tests.

另外，本文还针对IP核投片测试提出一种扫描测试电路结构，能够实现测试芯片的扫描测试和高速内建自测试(BIST)。

Based on the research of primary DFT method and the structure characteristic of designed CPU, the article combines the boundary scan and Build-In Self-Test based on BILBO to test.

本文在对目前主要的可测性设计方法进行研究的基础上，根据所设计CPU的结构特点，采用了边界扫描技术和基于BILBO的内建自测试技术结合的可测性设计方案。

As a new method of design for testability build-in self-test can prominently improve the testability of the circuits.

内建自测试作为一种新的可测性设计方法，能显著提高电路的可测性。